• Patent Title: Device and method for controlling the ceiling temperature of a CVD reactor
  • Application No.: US17250809
    Application Date: 2019-09-03
  • Publication No.: US11713505B2
    Publication Date: 2023-08-01
  • Inventor: Peter Sebald Lauffer
  • Applicant: AIXTRON SE
  • Applicant Address: DE Herzogenrath
  • Assignee: AIXTRON SE
  • Current Assignee: AIXTRON SE
  • Current Assignee Address: DE Herzogenrath
  • Agency: Ascenda Law Group, PC
  • Priority: DE 2018121854.0 2018.09.07
  • International Application: PCT/EP2019/073464 2019.09.03
  • International Announcement: WO2020/048981A 2020.03.12
  • Date entered country: 2021-03-04
  • Main IPC: C23C16/44
  • IPC: C23C16/44 C23C16/52
Device and method for controlling the ceiling temperature of a CVD reactor
Abstract:
A CVD reactor may include a susceptor, process chamber and heat dissipation body. In the CVD reactor, one or more layers can be deposited on one or more substrates. The susceptor is heated by a heating devices. Heat is transported from susceptor, through a process chamber towards the process chamber ceiling, through the process chamber ceiling, and from the process chamber ceiling through a gap space to the heat dissipation body. The temperature of the process chamber ceiling is measured at at least two different azimuth angle positions about a central axis of the process chamber. The radial distance of the respective measurement points or zones from the central axis of the process chamber may be equal to one another. The at least two temperature measurement values are used to produce an average value or a difference value.
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