Invention Grant
- Patent Title: Apparatus for evaluating high-temperature creep behavior of metals, and method of evaluating the same
-
Application No.: US17089567Application Date: 2020-11-04
-
Publication No.: US11714036B2Publication Date: 2023-08-01
- Inventor: Jin-Yoo Suh , Han-Jin Kim , Young Whan Cho , Woo Sang Jung , Jae-Hyeok Shim , Dong-Ik Kim , Young-Su Lee , Jihyun Hong
- Applicant: KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY
- Applicant Address: KR Seoul
- Assignee: Korea Institute of Science and Technology
- Current Assignee: Korea Institute of Science and Technology
- Current Assignee Address: KR Seoul
- Agency: Rabin & Berdo, P.C.
- Priority: KR 20190142855 2019.11.08
- Main IPC: G01N3/18
- IPC: G01N3/18 ; G01N3/10

Abstract:
Provided is an apparatus for evaluating high-temperature creep behavior of metals, the apparatus including a chamber configured to fix a metal sample in an inner space sealed from an external environment, and including, at a lower portion, a metal tube stretchable in a length direction by a pressure of a gas, wherein the apparatus is configured in such a manner that a load received by the chamber in the length direction due to the pressure of the gas injected into the chamber is applied to the metal sample.
Public/Granted literature
- US20210140862A1 APPARATUS FOR EVALUATING HIGH-TEMPERATURE CREEP BEHAVIOR OF METALS, AND METHOD OF EVALUATING THE SAME Public/Granted day:2021-05-13
Information query