Invention Grant
- Patent Title: Flow nanoparticle measurement device and method of determining nanoparticle using the same
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Application No.: US17505846Application Date: 2021-10-20
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Publication No.: US11714041B2Publication Date: 2023-08-01
- Inventor: Su Yeon Oh , Young Hoon Kim , Jun Hee Sung
- Applicant: DONGWOO FINE-CHEM CO., LTD.
- Applicant Address: KR Jeollabuk-do
- Assignee: DONGWOO FINE-CHEM CO., LTD.
- Current Assignee: DONGWOO FINE-CHEM CO., LTD.
- Current Assignee Address: KR Jeollabuk-do
- Agency: The PL Law Group, PLLC
- Priority: KR 20200136343 2020.10.20
- Main IPC: G01N15/02
- IPC: G01N15/02 ; G01B11/28 ; G01N15/00

Abstract:
A flow nanoparticle measurement device according to an embodiment of the present disclosure includes a flow cell configured to form a flow path through which a liquid sample flows, a laser generator configured to generate a first laser beam and irradiate the first laser beam to the flow cell, a plurality of detectors disposed in the flow cell and configured to detect a shock wave of a plasma generated in the flow cell by the first laser beam and generate a detection signal, and a controller configured to obtain the detection signal from the plurality of detectors and determine a type and a size of nanoparticles contained in the liquid sample in response to the detection signal.
Public/Granted literature
- US20220120654A1 FLOW NANOPARTICLE MEASUREMENT DEVICE AND METHOD OF DETERMINING NANOPARTICLE USING THE SAME Public/Granted day:2022-04-21
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