Invention Grant
- Patent Title: Specimen analysis system and specimen analysis method
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Application No.: US16579901Application Date: 2019-09-24
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Publication No.: US11714043B2Publication Date: 2023-08-01
- Inventor: Tomohiro Tsuji , Hiroo Tatsutani
- Applicant: SYSMEX CORPORATION
- Applicant Address: JP Kobe
- Assignee: SYSMEX CORPORATION
- Current Assignee: SYSMEX CORPORATION
- Current Assignee Address: JP Kobe
- Agency: Metrolex IP Law Group, PLLC
- Priority: JP 18180025 2018.09.26
- Main IPC: G01N15/14
- IPC: G01N15/14 ; G16H10/40

Abstract:
A specimen analysis system includes: a measurement data acquisition unit that acquires measurement data of particles obtained from a flow cytometer measuring the particles contained in a measurement specimen prepared by adding a reagent to a sample; an output mode information acquisition unit that acquires output mode information indicating an output form of the measurement data; and an output unit configured to output the measurement data in the output form in accordance with the output mode information.
Public/Granted literature
- US20200096432A1 SPECIMEN ANALYSIS SYSTEM AND SPECIMEN ANALYSIS METHOD Public/Granted day:2020-03-26
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