Invention Grant
- Patent Title: Abnormality determining method, and automatic analyzer
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Application No.: US17273822Application Date: 2019-10-11
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Publication No.: US11714095B2Publication Date: 2023-08-01
- Inventor: Hideto Tamezane , Masaharu Nishida
- Applicant: Hitachi High-Tech Corporation
- Applicant Address: JP Tokyo
- Assignee: HITACHI HIGH-TECH CORPORATION
- Current Assignee: HITACHI HIGH-TECH CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Baker Botts L.L.P.
- Priority: JP 18195477 2018.10.17
- International Application: PCT/JP2019/040146 2019.10.11
- International Announcement: WO2020/080271A 2020.04.23
- Date entered country: 2021-03-05
- Main IPC: G01N35/00
- IPC: G01N35/00 ; G01N21/77 ; G06F17/18

Abstract:
The present invention relates to an improved abnormality determining method for an automatic analyzer and related automatic analyzer that detects abnormalities for a reaction process of a reaction solution. The method for determining the presence of absence of abnormalities in the reaction process and performs the determination by acquiring acquisition conditions for multiple items of measured data, acquiring the measured data detected by a spectral detector that match the acquisition conditions, calculating a feature quantity of the measured data, generating a determination criterion based on the feature quantity, and determining the presence or absence of abnormalities by comparing the feature quantity of the measured data subject to the determination with the determination criterion. The acquisition condition includes information relating to a number of a divisions of a measured value range and information relating to the number of items of data in each divided segment.
Public/Granted literature
- US20210341502A1 ABNORMALITY DETERMINING METHOD, AND AUTOMATIC ANALYZER Public/Granted day:2021-11-04
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