Invention Grant
- Patent Title: Isolation measurement monitoring for ASIL applications
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Application No.: US17591489Application Date: 2022-02-02
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Publication No.: US11714111B2Publication Date: 2023-08-01
- Inventor: Jürgen Fritz , Peter Kurcik , Harald Reiter
- Applicant: SAMSUNG SDI CO., LTD.
- Applicant Address: KR Yongin-si
- Assignee: SAMSUNG SDI CO., LTD.
- Current Assignee: SAMSUNG SDI CO., LTD.
- Current Assignee Address: KR Yongin-si
- Agency: Lewis Roca Rothgerber Christie LLP
- Priority: EP 156823 2021.02.12 KR 20220008572 2022.01.20
- Main IPC: G01R27/02
- IPC: G01R27/02 ; G01R27/14

Abstract:
An electric circuit according to an embodiment of the present disclosure includes only a single amperemeter configured to measure either a positive current or a negative current through a respective measurement resistance between a respective high voltage potential and a common ground potential. The respective actual measurement resistance value of the unmeasured measurement resistance is calculated by applying a respectively calculated actual measurement resistance value of the respective measured measurement resistance, a calculated actual positive isolation resistance value, and a calculated negative isolation resistance value.
Public/Granted literature
- US20220260620A1 ISOLATION MEASUREMENT MONITORING FOR ASIL APPLICATIONS Public/Granted day:2022-08-18
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