Invention Grant
- Patent Title: Probe position monitoring structure and method of monitoring position of probe
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Application No.: US17010819Application Date: 2020-09-02
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Publication No.: US11714123B2Publication Date: 2023-08-01
- Inventor: Yasunobu Torii
- Applicant: United Semiconductor Japan Co., Ltd.
- Applicant Address: JP Kuwana
- Assignee: United Semiconductor Japan Co., Ltd.
- Current Assignee: United Semiconductor Japan Co., Ltd.
- Current Assignee Address: JP Kuwana
- Agent Winston Hsu
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01B7/00 ; G01R1/073

Abstract:
A probe position monitoring structure includes a first common line and a contact portion configured for being directly contacted with a probe. The contact portion includes a first zigzag structure, and a first end of the first zigzag structure is directly connected with the first common line. A method of monitoring a position of a probe includes the following steps. The probe position monitoring structure is provided. The first zigzag structure is directly contacted with a first probe. A resistance measurement is performed to measure a resistance of a portion of the first zigzag structure located between the first probe and the first end for monitoring a position of the first probe.
Public/Granted literature
- US20220065925A1 PROBE POSITION MONITORING STRUCTURE AND METHOD OF MONITORING POSITION OF PROBE Public/Granted day:2022-03-03
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