A method for detecting a fault includes: receiving a plurality of time-series sensor data obtained in one or more manufacturing processes of an electronic device; arranging the plurality of time-series sensor data in a two-dimensional (2D) data array; providing the 2D data array to a convolutional neural network model; identifying a pattern in the 2D data array that correlates to a fault condition using the convolutional neural network model; providing a fault indicator of the fault condition in the one or more manufacturing processes of the electronic device; and determining that the electronic device includes a fault based on the fault indicator. The 2D data array has a dimension of an input data to the convolutional neural network model.