A method for learning and detecting an abnormal part of a device through artificial intelligence comprises: an information collection step for collecting a current waveform of a current value that changes over time in a driving state of at least one device and collecting information about a faulty part of the device, together with current waveform information before a fault occurs in the device; a model setting step for learning, by a control unit, information collected in the information collection step and setting a reference model of a current waveform for each faulty part of the device; and a detection step for, when an abnormal symptom of the device is detected in a real-time driving state, comparing, by the control unit, a real-time current waveform of the device and the reference model, and detecting and providing an abnormal part regarding the abnormal symptom of the device.