Invention Grant
- Patent Title: Memory device with status feedback for error correction
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Application No.: US17721462Application Date: 2022-04-15
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Publication No.: US11714711B2Publication Date: 2023-08-01
- Inventor: Scott E. Schaefer , Aaron P. Boehm
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Holland & Hart LLP
- Main IPC: G06F11/10
- IPC: G06F11/10 ; G06F11/32 ; G06F11/30 ; G06F11/07

Abstract:
Methods, systems, and devices for a memory device with status feedback for error correction are described. For example, during a read operation, a memory device may perform an error correction operation on first data read from a memory array of the memory device. The error correction operation may generate second data and an indicator of a state of error corresponding to the second data. In one example, the indicator may indicate one of multiple possible states of error. In another example, the indicator may indicate a corrected error or no detectable error. The memory device may output the first or second data and the indicator of the state of error during a same burst interval. The memory device may output the data on a first channel and the indicator of the state of error on a second channel.
Public/Granted literature
- US20220237081A1 MEMORY DEVICE WITH STATUS FEEDBACK FOR ERROR CORRECTION Public/Granted day:2022-07-28
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