- Patent Title: Data readiness analysis system and data readiness analysis method
-
Application No.: US16942460Application Date: 2020-07-29
-
Publication No.: US11714798B2Publication Date: 2023-08-01
- Inventor: Ju-Hsin Kung , Chin-Wei Chang , Sheng-Hua Chen
- Applicant: Delta Electronics, Inc.
- Applicant Address: TW Taoyuan
- Assignee: DELTA ELECTRONICS, INC.
- Current Assignee: DELTA ELECTRONICS, INC.
- Current Assignee Address: TW Taoyuan
- Agency: Muncy, Geissler, Olds & Lowe, P.C.
- Priority: CN 2010381733.X 2020.05.08
- Main IPC: G06F16/00
- IPC: G06F16/00 ; G06F16/23 ; G06F16/28 ; G06F16/22 ; G06F16/215

Abstract:
A data analysis system is provided in the invention. The data analysis system includes a storage device, a field-data-description-file generating module, and a general data readiness analysis module. The storage device stores a plurality of raw data. The field-data-description-file generating module generates the field-data-description files corresponding to the raw data. The general data readiness analysis module obtains a score of the consistency indicator of the raw data according to the field-data-description files. The general data readiness analysis module obtains the data of the category which needs to be analyzed from the raw data according to the category of each field-data-description file. The general data analysis module obtains the score of the completeness indicator, the score of the accuracy indicator, the score of the validity indicator, and the score of the compaction indicator which all correspond to the data of the category which needs to be analyzed.
Public/Granted literature
- US20210349880A1 DATA READINESS ANALYSIS SYSTEM AND DATA READINESS ANALYSIS METHOD Public/Granted day:2021-11-11
Information query