Invention Grant
- Patent Title: Measuring integrity of computing system
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Application No.: US16007722Application Date: 2018-06-13
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Publication No.: US11714910B2Publication Date: 2023-08-01
- Inventor: Geoffrey Ndu , David Altobelli , Nigel Edwards , Luis Luciani, Jr.
- Applicant: HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP
- Applicant Address: US TX Houston
- Assignee: Hewlett Packard Enterprise Development LP
- Current Assignee: Hewlett Packard Enterprise Development LP
- Current Assignee Address: US TX Spring
- Agency: Trop, Pruner & Hu, P.C.
- Main IPC: G06F21/57
- IPC: G06F21/57 ; G06F21/55

Abstract:
Examples disclosed herein relate to integrity monitoring of a computing system. Trust of state information is verified. Kernel code and module code are loaded into memory that is accessible to a device separate from a processor that loads the kernel code and module code. A measurement module is verified and loaded into memory. The state information can correspond to multiple symbols. The measurement module can measure the state information corresponding to each of the respective symbols to generate a set of initial measurements. The set of initial measurements can be provided to a device for integrity monitoring.
Public/Granted literature
- US20190384918A1 MEASURING INTEGRITY OF COMPUTING SYSTEM Public/Granted day:2019-12-19
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