Invention Grant
- Patent Title: Device structure and methods of forming the same
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Application No.: US17368343Application Date: 2021-07-06
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Publication No.: US11715756B2Publication Date: 2023-08-01
- Inventor: Tsung-Chieh Hsiao , Hsiang-Ku Shen , Yuan-Yang Hsiao , Ying-Yao Lai , Dian-Hau Chen
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee Address: TW Hsinchu
- Agency: Nz Carr Law Office
- Main IPC: H01L23/00
- IPC: H01L23/00 ; H01L49/02

Abstract:
A device structure, along with methods of forming such, are described. The device structure includes a structure, a first passivation layer disposed on the structure, a buffer layer disposed on the first passivation layer, a barrier layer disposed on a first portion of the buffer layer, a redistribution layer disposed over the barrier layer, an adhesion layer disposed on the barrier layer and on side surfaces of the redistribution layer, and a second passivation layer disposed on a second portion of the buffer layer. The second passivation layer is in contact with the barrier layer, the adhesion layer, and the redistribution layer.
Public/Granted literature
- US20220328614A1 DEVICE STRUCTURE AND METHODS OF FORMING THE SAME Public/Granted day:2022-10-13
Information query
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