Invention Grant
- Patent Title: Memory device, semiconductor device, and method of fabricating semiconductor device
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Application No.: US17319115Application Date: 2021-05-13
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Publication No.: US11716859B2Publication Date: 2023-08-01
- Inventor: Carlos H. Diaz , Shy-Jay Lin , Ming-Yuan Song
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: JCIPRNET
- Main IPC: H10B61/00
- IPC: H10B61/00 ; H01L23/522 ; H01L23/528 ; H10N50/01 ; H10N50/80

Abstract:
A semiconductor device including a semiconductor substrate and an interconnect structure is provided. The semiconductor substrate includes a transistor, wherein the transistor has a source region and a drain region. The interconnect structure is disposed over the semiconductor substrate, wherein the interconnect structure includes a plurality of interlayer dielectric layers, a first via and a memory cell. The plurality of interlayer dielectric layers are over the semiconductor substrate. The first via is embedded in at least two interlayer dielectric layers among the plurality of interlayer dielectric layers and electrically connected with the drain region of the transistor. The memory cell is disposed over the at least two interlayer dielectric layers among the plurality of interlayer dielectric layers and electrically connected with the first via.
Public/Granted literature
- US20220367566A1 MEMORY DEVICE, SEMICONDUCTOR DEVICE, AND METHOD OF FABRICATING SEMICONDUCTOR DEVICE Public/Granted day:2022-11-17
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