Invention Grant
- Patent Title: Measurement sensor package and measurement sensor
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Application No.: US15778651Application Date: 2016-11-10
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Publication No.: US11717178B2Publication Date: 2023-08-08
- Inventor: Yasushi Oode , Hiroki Ito , Yoshimasa Sugimoto , Noritaka Niino , Shogo Matsunaga , Takuya Hayashi
- Applicant: KYOCERA Corporation
- Applicant Address: JP Kyoto
- Assignee: KYOCERA Corporation
- Current Assignee: KYOCERA Corporation
- Current Assignee Address: JP Kyoto
- Agency: Volpe Koenig
- Priority: JP 16011937 2016.01.25
- International Application: PCT/JP2016/083434 2016.11.10
- International Announcement: WO2017/130520A 2017.08.03
- Date entered country: 2018-05-24
- Main IPC: A61B5/0285
- IPC: A61B5/0285 ; G01P5/26 ; A61B5/00 ; A61B5/021 ; A61B5/026

Abstract:
A measurement sensor package and a measurement sensor reduce susceptibility to noise and enable highly accurate measurement. A measurement sensor package includes a substrate. The substrate includes a first recess including a first bottom surface on which a light emitter is mountable, and a first step surface having a first connection pad thereon, a second recess including a second bottom surface on which a light receiver is mountable, and a second step surface having a second connection pad thereon. In a direction connecting a center of the first bottom surface and a center of the second bottom surface in a plan view, the first step surface is located outward from the first bottom surface and the second step surface is located outward from the second bottom surface.
Public/Granted literature
- US20180353087A1 MEASUREMENT SENSOR PACKAGE AND MEASUREMENT SENSOR Public/Granted day:2018-12-13
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