Invention Grant
- Patent Title: Deposition method
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Application No.: US16875123Application Date: 2020-05-15
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Publication No.: US11718911B2Publication Date: 2023-08-08
- Inventor: Takashi Chiba , Jun Sato
- Applicant: Tokyo Electron Limited
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: IPUSA, PLLC
- Priority: JP 19094833 2019.05.20
- Main IPC: C23C16/455
- IPC: C23C16/455 ; C23C16/04 ; H01L21/02 ; C23C16/40

Abstract:
A deposition method includes causing aminosilane gas to be adsorbed on a substrate in which a recessed portion is formed on a surface of the substrate; causing a first silicon oxide film to be stacked on the substrate by supplying oxidation gas to the substrate to oxidize the aminosilane gas adsorbed on the substrate; and performing a reforming process on the first silicon oxide film by activating, by plasma, a first mixed gas including helium and oxygen, and supplying the first mixed gas to the first silicon oxide film.
Public/Granted literature
- US20200370178A1 DEPOSITION METHOD Public/Granted day:2020-11-26
Information query
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