Invention Grant
- Patent Title: Surface reference detecting mechanism and hardness tester
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Application No.: US17530957Application Date: 2021-11-19
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Publication No.: US11719610B2Publication Date: 2023-08-08
- Inventor: Yu Kawakubo
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JP 2020199450 2020.12.01
- Main IPC: G01N3/42
- IPC: G01N3/42

Abstract:
An indenter reference that is brought into contact with an axial second side surface of a sample which is arranged further toward an axial first side than an indenter, the indenter reference serving as a position reference for the indenter; a holder that detachably holds the indenter reference and is coupled with the indenter reference; an indenter position detector that couples with the holder and detects a relative position of the indenter with respect to the indenter reference; a regulator that allows displacement between a first position that regulates movement of the indenter reference with respect to the holder and a second position where the indenter reference can be removed from the holder; and a biasing portion that biases the regulator to be kept at the first position.
Public/Granted literature
- US20220170834A1 SURFACE REFERENCE DETECTING MECHANISM AND HARDNESS TESTER Public/Granted day:2022-06-02
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