Invention Grant
- Patent Title: Particle detection device
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Application No.: US16973432Application Date: 2018-06-22
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Publication No.: US11719615B2Publication Date: 2023-08-08
- Inventor: Kenya Nakai , Nozomi Enoki
- Applicant: Mitsubishi Electric Corporation
- Applicant Address: JP Tokyo
- Assignee: MITSUBISHI ELECTRIC CORPORATION
- Current Assignee: MITSUBISHI ELECTRIC CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Xsensus LLP
- International Application: PCT/JP2018/023741 2018.06.22
- International Announcement: WO2019/244325A 2019.12.26
- Date entered country: 2020-12-09
- Main IPC: G01N15/14
- IPC: G01N15/14 ; G01N15/10 ; G01M11/00 ; G01N21/94

Abstract:
A particle detection device includes: a first light source to emit first irradiation light; a first light-collection member; a second light-collection member facing the first reflection surface; a second light source to emit second irradiation light; and a first light-reception element. When the first light source emits the first irradiation light, the first light-reception element detects, as the first incident light, scattered light generated when a particle existing at a detection position in a target space is irradiated with the first irradiation light. When the second light source emits the second irradiation light, the first light-reception element detects, as the first incident light, a light ray of the second irradiation light that is reflected by the first reflection surface and a light ray of the second irradiation light that is reflected by both the first reflection surface and the second reflection surface.
Public/Granted literature
- US20210255086A1 PARTICLE DETECTION DEVICE Public/Granted day:2021-08-19
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