Invention Grant
- Patent Title: Measuring light scattering of a sample
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Application No.: US17477528Application Date: 2021-09-16
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Publication No.: US11719631B2Publication Date: 2023-08-08
- Inventor: Dwight Kahng , Cha Lee , Sigrid C. Kuebler , Ross E. Bryant
- Applicant: Wyatt Technology Corporation
- Applicant Address: US CA Goleta
- Assignee: WYATT TECHNOLOGY CORPORATION
- Current Assignee: WYATT TECHNOLOGY CORPORATION
- Current Assignee Address: US CA Goleta
- Agent Leonard T. Guzman
- Main IPC: G01N21/47
- IPC: G01N21/47 ; G06F3/04847
Abstract:
The present disclosure describes a computer implemented method, a system, and a computer program product of measuring light scattering of a sample.
Public/Granted literature
- US20220147234A1 MEASURING LIGHT SCATTERING OF A SAMPLE Public/Granted day:2022-05-12
Information query
