- Patent Title: Method of analyzing samples, analyzing device and computer program
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Application No.: US16625467Application Date: 2018-06-27
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Publication No.: US11719638B2Publication Date: 2023-08-08
- Inventor: Katja Eklin , Adyary Fallarero , Tommi Suvanto , Marika J. Raitio
- Applicant: Life Technologies Holdings PTE LTD
- Applicant Address: SG Singapore
- Assignee: Life Technologies Holdings PTE LTD
- Current Assignee: Life Technologies Holdings PTE LTD
- Current Assignee Address: SG Singapore
- Agency: BakerHostetler
- Priority: FI 175607 2017.06.27
- International Application: PCT/FI2018/050511 2018.06.27
- International Announcement: WO2019/002688A 2019.01.03
- Date entered country: 2019-12-20
- Main IPC: G01N21/25
- IPC: G01N21/25 ; G01N21/64 ; C12Q1/686

Abstract:
The method of analyzing one or more samples arranged in sample receptacles of a platform that is configured to receive a plurality of separate samples includes the steps of measuring electromagnetic radiation transmitted or emitted by each sample, repeating the measurement a plurality of times at predetermined intervals, on the basis of each measurement, forming a result matrix comprising a plurality of cells, each cell of the result matrix corresponding to a sample receptacle of the plat-form, wherein a measurement value of each sample is used as an input for determining the visual properties of the respective cell in the result matrix, and displaying the results as consecutive matrixes in respect of time.
Public/Granted literature
- US20210148822A1 Method of Analyzing Samples, Analyzing Device and Computer Program Public/Granted day:2021-05-20
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