- Patent Title: Embedded logic analyzer and integrated circuit including the same
-
Application No.: US17337517Application Date: 2021-06-03
-
Publication No.: US11719747B2Publication Date: 2023-08-08
- Inventor: Joon-Won Ko
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR 20150114422 2015.08.13
- Main IPC: G01R31/317
- IPC: G01R31/317 ; H03K19/173 ; H03K19/17764 ; H03K5/26 ; G01R31/3177

Abstract:
An embedded logic analyzer of an integrated circuit includes a comparison block configured to generate a capture data signal and a plurality of comparison enable signals based on an input data signal from one of function blocks included in the integrated circuit such that the comparison enable signals are activated respectively based on different comparison conditions; an operation block configured to perform a logic operation on the comparison enable signals to generate a data enable signal indicating a data capture timing; and packer circuitry configured to generate a packer data signal including capture data and capture time information based on the capture data signal, the data enable signal and a time information signal.
Public/Granted literature
- US20210286001A1 EMBEDDED LOGIC ANALYZER AND INTEGRATED CIRCUIT INCLUDING THE SAME Public/Granted day:2021-09-16
Information query