- Patent Title: Electronic device and fault diagnosis method of electronic device
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Application No.: US17261433Application Date: 2019-07-31
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Publication No.: US11720435B2Publication Date: 2023-08-08
- Inventor: Minji Park , Jeehyeok Kim
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Nixon & Vanderhye, P.C.
- Priority: KR 20180089342 2018.07.31
- International Application: PCT/KR2019/009509 2019.07.31
- International Announcement: WO2020/027560A 2020.02.06
- Date entered country: 2021-01-19
- Main IPC: G06F11/07
- IPC: G06F11/07 ; G06F11/32

Abstract:
An electronic device for diagnosing a fault of a plurality of external devices is disclosed. The electronic device comprises a communication unit and a processor. The processor receives, from the plurality of external devices, information related to an operation of the plurality of external devices through the communication unit; on the basis of the information related to the operation of any one of the plurality of external devices, determines whether any external device is operating abnormally; when the external device is operating abnormally, diagnoses the cause of the abnormality on the basis of the information related to the operation of the one external device and information related to an operation of another external device of the plurality of external devices that is relevant to the operation of the one external device; and provides, via the communication unit, information on the diagnosed abnormality to the at least one of the one external device and a communication device of a user of the external devices.
Public/Granted literature
- US20210311812A1 ELECTRONIC DEVICE AND FAULT DIAGNOSIS METHOD OF ELECTRONIC DEVICE Public/Granted day:2021-10-07
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