Invention Grant
- Patent Title: Event input device testing
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Application No.: US17748161Application Date: 2022-05-19
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Publication No.: US11720459B2Publication Date: 2023-08-08
- Inventor: Benjamin H. Wolf , Michael Barson , Christopher Dearden
- Applicant: Honeywell International Inc.
- Applicant Address: US NC Charlotte
- Assignee: Honeywell International Inc.
- Current Assignee: Honeywell International Inc.
- Current Assignee Address: US NC Charlotte
- Agency: Brooks, Cameron & Huebsch, PLLC
- Main IPC: G06F11/26
- IPC: G06F11/26 ; G08B5/22 ; G06F11/22 ; G08B1/08 ; G05B15/02 ; G08B29/14 ; G08B29/16 ; G08B29/18

Abstract:
Devices, systems, and methods for event input device testing are described herein. In some examples, one or more embodiments include a controller comprising a memory and a processor to execute instructions stored in the memory to cause a first event input device of a group of event input devices to perform an automated test process, and determine whether a second event input device of the group of event input devices has detected a hazard event while the first event input device is performing the automated test process.
Public/Granted literature
- US20220276943A1 EVENT INPUT DEVICE TESTING Public/Granted day:2022-09-01
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