Invention Grant
- Patent Title: Generating test data for a memory system design based on operation of a test system, and related methods, devices, and systems
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Application No.: US17395988Application Date: 2021-08-06
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Publication No.: US11721406B2Publication Date: 2023-08-08
- Inventor: Won Ho Choi , Randall J. Rooney
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: TraskBritt
- Main IPC: G11C29/14
- IPC: G11C29/14 ; G11C11/406 ; G11C29/46 ; G11C29/12

Abstract:
Methods and systems for testing memory systems are disclosed. A refresh rate for a test system including a number of memory devices may be controlled based on estimated power scenario of a memory system design. In response to performance of a number of refresh operations on the memory devices and based on the refresh rate, one or more conditions of the test system may be monitored to generate estimated performance data for the memory system design.
Public/Granted literature
- US20230037415A1 MEMORY SYSTEM TESTING, AND RELATED METHODS, DEVICES, AND SYSTEMS Public/Granted day:2023-02-09
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