An arc fault detection system with a built-in-test includes an arc fault detector having a load noise voltage input, a test current input and an arc fault detector output. The system includes a processing unit having a switch in electrical communication with the test current input and an input in electrical communication with the arc fault detector output. A method for testing an arc fault detection system includes generating a new bit with a processing unit and outputting the new bit to a switch operatively connected to the processing unit to at least one of turn the switch on or turn the switch off. The method includes reading a signal at an input of the processing unit.