Invention Grant
- Patent Title: Amplitude and biphase control of MEMS scanning device
-
Application No.: US17832180Application Date: 2022-06-03
-
Publication No.: US11743434B2Publication Date: 2023-08-29
- Inventor: Michael Edward Samples , Mikhail Smirnov , Jozef Barnabas Houben , Damon Marlow Domjan , Joshua Owen Miller
- Applicant: Microsoft Technology Licensing, LLC
- Applicant Address: US WA Redmond
- Assignee: Microsoft Technology Licensing, LLC
- Current Assignee: Microsoft Technology Licensing, LLC
- Current Assignee Address: US WA Redmond
- Agency: Workman Nydegger
- Main IPC: H04N9/31
- IPC: H04N9/31 ; G01K13/08 ; G02B26/08 ; G02B26/10 ; G06F18/25

Abstract:
A MEMS scanning device (“Device”) includes at least (1) laser projector(s) controlled by a laser drive to project a laser beam, (2) MEMS scanning mirror(s) controlled by a MEMS drive to scan the laser beam to generate a raster scan, (3) a display configured to receive the raster scan, (4) a thermometer configured to detect a current temperature, (5) a display observing camera configured to capture an image of a predetermined area of the display, and (6) a computer-readable media that stores temperature model(s), each of which is custom-built using machine learning. The device uses the display observing camera to capture image(s) of predetermined pattern(s), which are then used to extract feature(s). The extracted feature(s) are compared with ideal feature(s) to identify a discrepancy. When the identified discrepancy is greater than a threshold, the temperature model(s) are updated accordingly.
Public/Granted literature
- US20220303513A1 AMPLITUDE AND BIPHASE CONTROL OF MEMS SCANNING DEVICE Public/Granted day:2022-09-22
Information query