Invention Grant
- Patent Title: Semiconductor devices and method of forming the same
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Application No.: US17364862Application Date: 2021-06-30
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Publication No.: US11744084B2Publication Date: 2023-08-29
- Inventor: Hsiang-Ku Shen , Liang-Wei Wang , Dian-Hau Chen , Yen-Ming Chen
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: JCIPRNET
- Main IPC: H10B61/00
- IPC: H10B61/00 ; H01L23/48 ; H01L21/762 ; H01L29/40 ; H01L23/522

Abstract:
A semiconductor device includes a semiconductor substrate, a gate structure, a source region, a drain region, an interconnect structure, a memory cell and a conductive via. The semiconductor substrate has a first side and a second side opposite to the first side. The gate structure is disposed over the first side of the semiconductor substrate. The source region and the drain region are disposed in the semiconductor substrate aside the gate structure. The interconnect structure is disposed over the first side of the semiconductor substrate and electrically connected to the source region. The memory cell is disposed over the second side of the semiconductor substrate and electrically connected to the drain region. The conductive via is disposed in the semiconductor substrate between the drain region and the memory cell and electrically connects the drain region and the memory cell.
Public/Granted literature
- US20220285436A1 SEMICONDUCTOR DEVICES AND METHOD OF FORMING THE SAME Public/Granted day:2022-09-08
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