Invention Grant
- Patent Title: System and method for characterizing defects in electronic items using magnetic field detection
-
Application No.: US17654349Application Date: 2022-03-10
-
Publication No.: US11747407B2Publication Date: 2023-09-05
- Inventor: C. MacGill Lynde , Derek Platt , Christopher A. Wiklof , Alan Corwin , Ronald Schoenberg
- Applicant: INNOVAURA CORPORATION
- Applicant Address: US WA Camano Island
- Assignee: Innovaura Corporation
- Current Assignee: Innovaura Corporation
- Current Assignee Address: US WA Brier
- Agency: Launchpad IP, Inc.
- Agent Christopher A. Wiklof; Harold H. Bennett, II
- Main IPC: G01R33/00
- IPC: G01R33/00 ; H04B17/00 ; G06T7/70 ; G06F3/14

Abstract:
An electronic circuit triage device diagnoses functionality of various electronic circuits of an electronic device. The electronic circuit triage device detects whether an electronic circuit is functioning properly by measuring a magnetic field pattern associated with the electronic circuit and comparing the magnetic field pattern to an expected magnetic field pattern.
A magnetic sensor array includes non-packaged magnetic sensors disposed on a substrate. The non-packaged magnetic sensors can include bare dice, in one embodiment. In another embodiment, the magnetic sensors are formed directly on the substrate, such as by printing conductive traces on the substrate. In another embodiment, a magnetic sensor array includes a magnetic field converter configured to launch received magnetic fields along an axis corresponding to a magnetic sensor maximum sensitivity.
A magnetic sensor array includes non-packaged magnetic sensors disposed on a substrate. The non-packaged magnetic sensors can include bare dice, in one embodiment. In another embodiment, the magnetic sensors are formed directly on the substrate, such as by printing conductive traces on the substrate. In another embodiment, a magnetic sensor array includes a magnetic field converter configured to launch received magnetic fields along an axis corresponding to a magnetic sensor maximum sensitivity.
Public/Granted literature
- US20220196761A1 SYSTEM AND METHOD FOR CHARACTERIZING DEFECTS IN ELECTRONIC ITEMS USING MAGNETIC FIELD DETECTION Public/Granted day:2022-06-23
Information query