Invention Grant
- Patent Title: Sensor apparatus
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Application No.: US17415940Application Date: 2018-12-20
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Publication No.: US11747513B2Publication Date: 2023-09-05
- Inventor: Jens Ottnad , Dennis Wolf , Kevin Lutz , Christoph Blömker , Michael Burger , Peter Steurer , Günter Hirt , Stefan Kienzler
- Applicant: SICK AG , TRUMPF Werkzeugmaschinen GmbH + Co. KG
- Applicant Address: DE Waldkirch/Breisgau
- Assignee: SICK AG,TRUMPF WERKZEUGMASCHINEN SE + CO. KG
- Current Assignee: SICK AG,TRUMPF WERKZEUGMASCHINEN SE + CO. KG
- Current Assignee Address: DE Waldkirch/Breisgau; DE Ditzingen
- Agency: GLOBAL IP COUNSELORS, LLP
- International Application: PCT/EP2018/086311 2018.12.20
- International Announcement: WO2020/126006A 2020.06.25
- Date entered country: 2021-06-18
- Main IPC: G01V8/20
- IPC: G01V8/20 ; B23Q15/007

Abstract:
A sensor apparatus for detecting a target object influenced by a process or formed in the process includes a sensor unit and an evaluation device. The sensor unit detects the target object in a detection zone of the sensor unit and generates a sensor signal that can be influenced by the target object. The evaluation device processes the sensor signal as a first input variable and generates an output signal, which indicates the detection of the target object, in dependence on the sensor signal. The evaluation device further processes a process parameter of the process, which acts on the target object, or a target object parameter, which characterizes the target object and is influenced by the process, as a respective further input variable and to generate the output signal in dependence on the process parameter and/or the target object parameter.
Public/Granted literature
- US20220082724A1 SENSOR APPARATUS Public/Granted day:2022-03-17
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