Invention Grant
- Patent Title: Photonic semiconductor device and method of manufacture
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Application No.: US17818845Application Date: 2022-08-10
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Publication No.: US11747563B2Publication Date: 2023-09-05
- Inventor: Hsing-Kuo Hsia , Chen-Hua Yu , Kuo-Chiang Ting , Shang-Yun Hou
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee Address: TW Hsinchu
- Agency: Slater Matsil, LLP
- The original application number of the division: US17226542 2021.04.09
- Main IPC: G02B6/12
- IPC: G02B6/12 ; G02B6/13 ; G02B6/124

Abstract:
A method includes forming a first photonic package, wherein forming the first photonic package includes patterning a silicon layer to form a first waveguide, wherein the silicon layer is on an oxide layer, and wherein the oxide layer is on a substrate; forming vias extending into the substrate; forming a first redistribution structure over the first waveguide and the vias, wherein the first redistribution structure is electrically connected to the vias; connecting a first semiconductor device to the first redistribution structure; removing a first portion of the substrate to form a first recess, wherein the first recess exposes the oxide layer; and filling the first recess with a first dielectric material to form a first dielectric region.
Public/Granted literature
- US20220381985A1 Photonic Semiconductor Device and Method of Manufacture Public/Granted day:2022-12-01
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