Invention Grant
- Patent Title: Freeze-less methods for self-aligned double patterning
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Application No.: US17455753Application Date: 2021-11-19
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Publication No.: US11747733B2Publication Date: 2023-09-05
- Inventor: Michael Murphy , Charlotte Cutler
- Applicant: Tokyo Electron Limited
- Applicant Address: JP Tokyo
- Assignee: TOKYO ELECTRON LIMITED
- Current Assignee: TOKYO ELECTRON LIMITED
- Current Assignee Address: JP Tokyo
- Agency: Slater Matsil, LLP
- Main IPC: G03F7/32
- IPC: G03F7/32 ; G03F7/16 ; G03F7/11

Abstract:
A method of patterning a substrate includes depositing an overcoat in openings of a relief pattern. The relief pattern includes a solubility-shifting agent and a deprotectable monomer sensitive to the solubility-shifting agent. The overcoat includes another deprotectable monomer sensitive to the solubility-shifting agent. The overcoat has a solubility threshold relative to a predetermined developer that is lower than the solubility threshold of the relief pattern relative to the developer. The method includes activating the solubility-shifting agent to at least reach the solubility threshold of the overcoat without reaching the solubility threshold of the relief pattern, diffusing the solubility-shifting agent a predetermined distance from structures of the relief pattern into the overcoat to form soluble regions in the overcoat, and developing the substrate with the developer to remove the soluble regions of the overcoat. The soluble regions are soluble in the developer while the relief pattern remains insoluble in the developer.
Public/Granted literature
- US20220221797A1 Freeze-less Methods for Self-Aligned Double Patterning Public/Granted day:2022-07-14
Information query
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