There is provided a system and method of analysing anomalies in one or more electronic appliances including at least one computer. The method comprises, by a processor and memory circuitry, upon detection of a deviation of a given parameter representative of the one or more electronic appliances from an operational state, providing a model associated with the given parameter, wherein the model links one or more other parameters to the given parameter, wherein the one or more other parameters affect the given parameter, and based at least on the model, identifying, among the one or more other parameters, at least one parameter Pj for which a change in its value allows bringing back the given parameter to the operational state.