Invention Grant
- Patent Title: Machine learning model monitoring
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Application No.: US16935670Application Date: 2020-07-22
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Publication No.: US11748638B2Publication Date: 2023-09-05
- Inventor: Rafal Bigaj , Lukasz G. Cmielowski , Wojciech Sobala , Maksymilian Erazmus
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Mark Bergner
- Main IPC: G06N5/04
- IPC: G06N5/04 ; G06N20/00

Abstract:
A dataset is received that is for processing by a machine learning model. A scoring payload for the dataset and that regards the machine learning model is also received. A set of features of the machine learning model is determined by analyzing the scoring payload. The scoring payload is structured in accordance with the set of features such that the structured scoring payload is ready for analysis for a monitor of the machine learning model.
Public/Granted literature
- US20220027749A1 MACHINE LEARNING MODEL MONITORING Public/Granted day:2022-01-27
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