Invention Grant
- Patent Title: Surface inspection apparatus, non-transitory computer readable medium storing program, and surface inspection method
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Application No.: US17577375Application Date: 2022-01-18
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Publication No.: US11748925B2Publication Date: 2023-09-05
- Inventor: Miho Uno , Kazuya Fukunaga , Yoshitaka Kuwada
- Applicant: FUJIFILM Business Innovation Corp.
- Applicant Address: JP Tokyo
- Assignee: FUJIFILM Business Innovation Corp.
- Current Assignee: FUJIFILM Business Innovation Corp.
- Current Assignee Address: JP Tokyo
- Agency: JCIPRNET
- Priority: JP 21148133 2021.09.10
- Main IPC: G06T11/20
- IPC: G06T11/20 ; G06T7/40
Abstract:
A surface inspection apparatus includes an imaging device that images a surface of an object to be inspected; and a processor configured to: calculate a texture of the object through processing of an image imaged by the imaging device; and display a symbol representing the texture of the object at a coordinate position on a multidimensional distribution map.
Public/Granted literature
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