Invention Grant
- Patent Title: Semiconductor device, capacitor device and manufacture method of capacitor device
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Application No.: US17455498Application Date: 2021-11-18
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Publication No.: US11749669B2Publication Date: 2023-09-05
- Inventor: Cheng-Hung Hsu
- Applicant: CHANGXIN MEMORY TECHNOLOGIES, INC.
- Applicant Address: CN Hefei
- Assignee: CHANGXIN MEMORY TECHNOLOGIES, INC.
- Current Assignee: CHANGXIN MEMORY TECHNOLOGIES, INC.
- Current Assignee Address: CN Hefei
- Agency: COOPER LEGAL GROUP, LLC
- Priority: CN 2010565258.1 2020.06.19
- Main IPC: H01L27/108
- IPC: H01L27/108 ; H01L27/01

Abstract:
The present disclosure provides a semiconductor device, and a capacitor device and its manufacture method, and relates to the field of semiconductor technologies. The manufacture method includes: forming, on a substrate, a plurality of storage node contact plugs distributed in an array and an insulation layer separating each of the storage node contact plugs; forming an electrode supporting structure on a side of the insulation layer away from the substrate, the electrode supporting structure having a plurality of through holes exposing each of the storage node contact plugs respectively, the through hole comprising a plurality of hole segments end-to-end jointing successively, the hole segment located on a side close to the substrate having an aperture greater than the hole segment located on a side away from the substrate; forming a dielectric layer; forming a second electrode layer.
Public/Granted literature
- US20220077133A1 SEMICONDUCTOR DEVICE, CAPACITOR DEVICE AND MANUFACTURE METHOD OF CAPACITOR DEVICE Public/Granted day:2022-03-10
Information query
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