- Patent Title: Identifying a dynamic network parameter probe interval in an SD-WAN
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Application No.: US17189750Application Date: 2021-03-02
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Publication No.: US11750512B2Publication Date: 2023-09-05
- Inventor: Gopal Gupta , Abhinesh Mishra , Isaac Theogaraj
- Applicant: Hewlett Packard Enterprise Development LP
- Applicant Address: US TX Houston
- Assignee: Hewlett Packard Enterprise Development LP
- Current Assignee: Hewlett Packard Enterprise Development LP
- Current Assignee Address: US TX Spring
- Agency: Hewlett Packard Enterprise Patent Department
- Main IPC: H04L45/64
- IPC: H04L45/64 ; H04L41/12 ; H04L45/50 ; H04W76/12 ; H04W76/15 ; H04L45/00

Abstract:
Some examples relate to identifying a dynamic network parameter probe interval in an SD-WAN. In an example, a controller may define a probe profile of an uplink in the SD-WAN. The probe profile of the uplink may include a static probe interval and a probe retry value. The controller may determine the value of the network parameter for the uplink, prior to expiration of a static probe timer interval. If the value of the network parameter is in negative deviation with a baseline value of the network parameter, the controller may identify a dynamic probe interval for each successive determination of the value of the network parameter. The identification of the dynamic probe interval for a given successive determination may depend on at least one previously determined value of the network parameter. The controller may initiate duplicate network traffic on a secondary uplink in the SD-WAN.
Public/Granted literature
- US20210336880A1 IDENTIFYING A DYNAMIC NETWORK PARAMETER PROBE INTERVAL IN AN SD-WAN Public/Granted day:2021-10-28
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