Invention Grant
- Patent Title: Measuring frequency of microwave signal
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Application No.: US17128206Application Date: 2020-12-21
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Publication No.: US11754601B2Publication Date: 2023-09-12
- Inventor: Jianyong Hu , Ruiyun Chen , Chengbing Qin , Guofeng Zhang , Jie Ma , Liantuan Xiao , Suotang Jia
- Applicant: SHANXI UNIVERSITY
- Applicant Address: CN Shanxi
- Assignee: SHANXI UNIVERSITY
- Current Assignee: SHANXI UNIVERSITY
- Current Assignee Address: CN Shanxi
- Agency: JCIP GLOBAL INC.
- Priority: CN 2010435638.3 2020.05.21
- Main IPC: G01R23/02
- IPC: G01R23/02 ; G01R23/16

Abstract:
A frequency measurement method and a system thereof are provided. The method includes: generating to-be-detected emergent light under an action of the electro-optical crystal when a light source irradiates an electro-optical crystal disposed in the microwave electric field; detecting, by a single-photon detector, the to-be-detected emergent light to obtain a detection result of the single-photon detector; and determining a frequency of the microwave signal based on the detection result of the single-photon detector and a Fourier transform algorithm.
Public/Granted literature
- US20210364559A1 MEASURING FREQUENCY OF MICROWAVE SIGNAL Public/Granted day:2021-11-25
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