Invention Grant
- Patent Title: Transformer test system and method
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Application No.: US17494586Application Date: 2021-10-05
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Publication No.: US11754641B2Publication Date: 2023-09-12
- Inventor: Lam Truong Nguyen , Yuan Wei
- Applicant: AVO Multi-Amp Corporation
- Applicant Address: US TX Dallas
- Assignee: AVO Multi-Amp Corporation
- Current Assignee: AVO Multi-Amp Corporation
- Current Assignee Address: US TX Dallas
- Agency: Conley Rose, P.C.
- Agent J. Robert Brown, Jr.
- Main IPC: G01R31/62
- IPC: G01R31/62 ; H01H9/00

Abstract:
A system for testing a transformer includes a voltage source configured to apply an input voltage to a secondary winding of the transformer, the input voltage is configured to induce a voltage in a primary winding of the transformer. A primary voltmeter is configured to measure the induced voltage in the primary winding, a plurality of secondary voltmeters configured to measure voltage in a plurality of secondary windings of the transformer, and one or more phase angle meters to simultaneously measure a plurality of phase angles between the primary voltage and each of the plurality of secondary voltages. A controller is connected to the voltage source, the primary voltmeter, the plurality of secondary voltmeters, and the one or more phase angle meters, the controller is configured to calculate a plurality of winding ratios based on the voltage and phase angle measurements, the controller is also configured to identify all secondary taps.
Public/Granted literature
- US20220107365A1 Transformer Test System and Method Public/Granted day:2022-04-07
Information query