- Patent Title: Apparatus and method for lesion analysis based on marginal feature
-
Application No.: US17332380Application Date: 2021-05-27
-
Publication No.: US11756207B2Publication Date: 2023-09-12
- Inventor: Hyunjin Park , Hwanho Cho , Ho Yun Lee
- Applicant: Research & Business Foundation Sungkyunkwan University , SAMSUNG LIFE PUBLIC WELFARE FOUNDATION
- Applicant Address: KR Suwon-si
- Assignee: Research & Business Foundation Sungkyunkwan University,SAMSUNG LIFE PUBLIC WELFARE FOUNDATION
- Current Assignee: Research & Business Foundation Sungkyunkwan University,SAMSUNG LIFE PUBLIC WELFARE FOUNDATION
- Current Assignee Address: KR Suwon-si; KR Seoul
- Agency: NSIP Law
- Priority: KR 20200110864 2020.09.01
- Main IPC: G06T7/13
- IPC: G06T7/13 ; G06T7/11 ; G06T7/40 ; A61B6/03

Abstract:
Disclosed are an apparatus and a method for lesion analysis based on a marginal feature. The method for lesion analysis based on a marginal feature according to an embodiment of the present disclosure may include receiving image data for a target region, identifying a lesion region from the image data, deriving a marginal feature for a lesion based on intensity information of the identified lesion region, and inferring an attribute associated with the lesion based on the marginal feature.
Public/Granted literature
- US20220067945A1 APPARATUS AND METHOD FOR LESION ANALYSIS BASED ON MARGINAL FEATURE Public/Granted day:2022-03-03
Information query