Invention Grant
- Patent Title: Electronic control unit testing optimization
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Application No.: US17015239Application Date: 2020-09-09
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Publication No.: US11756349B2Publication Date: 2023-09-12
- Inventor: Jianwu Xu , Haifeng Chen
- Applicant: NEC Laboratories America, Inc.
- Applicant Address: US NJ Princeton
- Assignee: NEC Laboratories America, Inc.
- Current Assignee: NEC Laboratories America, Inc.
- Current Assignee Address: US NJ Princeton
- Agent Joseph Kolodka
- Main IPC: G07C5/08
- IPC: G07C5/08 ; B60W50/02 ; G01R31/317 ; G06N3/082 ; B60W50/06 ; B60W60/00 ; B60R16/023 ; G06N3/088 ; G06V20/20 ; G06V20/56 ; G06F18/214 ; G06N3/044 ; G06N3/045 ; G06V10/764 ; G06V10/82 ; G05D1/00

Abstract:
A computer-implemented method for implementing electronic control unit (ECU) testing optimization includes capturing, within a neural network model, input-output relationships of a plurality of ECUs operatively coupled to a controller area network (CAN) bus within a CAN bus framework, including generating the neural network model by pruning a fully-connected neural network model based on comparisons of maximum values of neuron weights to a threshold, reducing signal connections of a plurality of collected input signals and a plurality of collected output signals based on connection weight importance, ranking importance of the plurality of collected input signals based on the neural network model, generating, based on the ranking, a test case execution sequence for testing a system including the plurality of ECUs to identify flaws in the system, and initiating the test case execution sequence for testing the system.
Public/Granted literature
- US20210078589A1 ELECTRONIC CONTROL UNIT TESTING OPTIMIZATION Public/Granted day:2021-03-18
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