Invention Grant
- Patent Title: Interconnection structure and methods of forming the same
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Application No.: US17313217Application Date: 2021-05-06
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Publication No.: US11756884B2Publication Date: 2023-09-12
- Inventor: Wei-Hao Liao , Hsi-Wen Tien , Yu-Teng Dai , Chih Wei Lu , Hsin-Chieh Yao , Chung-Ju Lee
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee Address: TW Hsinchu
- Agency: NZ CARR LAW OFFICE
- Main IPC: H01L23/528
- IPC: H01L23/528 ; H01L21/768 ; H01L23/532

Abstract:
An interconnect structure includes dielectric layer, a first conductive feature, a second conductive feature, a third conductive feature, and a dielectric fill. The first conductive feature is disposed in the dielectric layer. The second conductive feature is disposed over the first conductive feature. The second conductive feature includes a first conductive layer disposed over the first conductive feature, a second conductive layer disposed on the first conductive layer, and a third conductive layer disposed on the second conductive layer. The first conductive layer, the second conductive layer and the third conductive layer have substantially the same width. The third conductive feature is disposed over the dielectric layer. The dielectric fill is disposed over the dielectric layer between the second conductive feature and the third conductive feature.
Public/Granted literature
- US20220359368A1 INTERCONNECTION STRUCTURE AND METHODS OF FORMING THE SAME Public/Granted day:2022-11-10
Information query
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