Invention Grant
- Patent Title: Reduced kapitza resistance microwave filter for cryogenic environments
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Application No.: US18063150Application Date: 2022-12-08
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Publication No.: US11757169B2Publication Date: 2023-09-12
- Inventor: Patryk Gumann , Salvatore Bernardo Olivadese
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee Address: US NY Armonk
- Agency: Amin, Turocy & Watson, LLP
- The original application number of the division: US16149837 2018.10.02
- Main IPC: H01P1/30
- IPC: H01P1/30 ; H01P1/203 ; H01B12/02 ; G06N10/00 ; H01P1/20 ; H01P3/00 ; H01P11/00 ; H05K7/20 ; H01P1/22

Abstract:
An architecture for, and techniques for fabricating, a thermal decoupling device are provided. In some embodiments, thermal decoupling device can be included in a thermally decoupled cryogenic microwave filter. In some embodiments, the thermal decoupling device can comprise a dielectric material and a conductive line. The dielectric material can comprise a first channel that is separated from a second channel by a wall of the dielectric material. The conductive line can comprise a first segment and a second segment that are separated by the wall. The wall can facilitate propagation of a microwave signal between the first segment and the second segment and can reduce heat flow between the first segment and the second segment of the conductive line.
Public/Granted literature
- US20230198115A1 REDUCED KAPITZA RESISTANCE MICROWAVE FILTER FOR CRYOGENIC ENVIRONMENTS Public/Granted day:2023-06-22
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