Invention Grant
- Patent Title: System and method for reducing cell area and current leakage in anti-fuse cell array
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Application No.: US17876103Application Date: 2022-07-28
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Publication No.: US11758715B2Publication Date: 2023-09-12
- Inventor: Meng-Sheng Chang , Chia-En Huang , Shao-Yu Chou , Yih Wang
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee Address: TW Hsinchu
- Agency: FOLEY & LARDNER LLP
- The original application number of the division: US16786499 2020.02.10
- Main IPC: H10B20/20
- IPC: H10B20/20 ; H01L23/528 ; H01L23/532 ; G11C17/16 ; G06F30/392 ; H01L23/525 ; G11C17/18

Abstract:
A memory device includes a first memory cell having a first polysilicon line associated with a first read word line and intersecting a first active region and a second active region, and a second polysilicon line and a first CPODE associated with a first program word line, the second polysilicon line intersecting the first active region and the first CPODE intersecting the second active region. The memory device also includes a second memory cell adjacent to the first memory cell, the second memory cell having a third polysilicon line associated with a second read word line and intersecting the first active region and the second active region, and a fourth polysilicon line and a second CPODE associated with a second program word line, the fourth polysilicon line intersecting the second active region and the second CPODE intersecting the first active region to form a cross-arrangement of CPODE.
Public/Granted literature
- US20220367492A1 SYSTEM AND METHOD FOR REDUCING CELL AREA AND CURRENT LEAKAGE IN ANTI-FUSE CELL ARRAY Public/Granted day:2022-11-17
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