Invention Grant
- Patent Title: Measurement method, measurement device, measurement system, and measurement program
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Application No.: US17203941Application Date: 2021-03-17
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Publication No.: US11761812B2Publication Date: 2023-09-19
- Inventor: Yoshihiro Kobayashi
- Applicant: Seiko Epson Corporation
- Applicant Address: JP Toyko
- Assignee: Seiko Epson Corporation
- Current Assignee: Seiko Epson Corporation
- Current Assignee Address: JP Toyko
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: JP 20047135 2020.03.18
- Main IPC: G01G19/03
- IPC: G01G19/03 ; G01H17/00

Abstract:
A measurement method includes: a step of acquiring first observation point information including a time point when each part of a moving object passes a first observation point and a physical quantity which is a response to an action; a step of acquiring second observation point information including a time point when the each part passes a second observation point and a physical quantity which is a response to an action; a step of calculating a deflection waveform of a structure generated by the each part; a step of adding the deflection waveforms to calculate a moving object deflection waveform, and calculating a path deflection waveform based on the moving object deflection waveform; a step of calculating a displacement waveform by twice integrating an acceleration of a third observation point; and a step of calculating, based on the path deflection waveform, a value of each coefficient of a polynomial approximating an integration error, and correcting the displacement waveform based on the value of each coefficient.
Public/Granted literature
- US20210302222A1 Measurement Method, Measurement Device, Measurement System, And Measurement Program Public/Granted day:2021-09-30
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