Invention Grant
- Patent Title: System and method for detecting corruption of a deduplicated cloud object
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Application No.: US17073667Application Date: 2020-10-19
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Publication No.: US11762564B2Publication Date: 2023-09-19
- Inventor: Jagannathdas Rath , Kalyan C. Gunda
- Applicant: EMC IP Holding Company LLC
- Applicant Address: US MA Hopkinton
- Assignee: EMC IP HOLDING COMPANY LLC
- Current Assignee: EMC IP HOLDING COMPANY LLC
- Current Assignee Address: US MA Hopkinton
- Agency: WOMBLE BOND DICKINSON (US) LLP
- Main IPC: G06F3/06
- IPC: G06F3/06

Abstract:
A method of detecting object corruption of deduplicated cloud objects includes a two-layered approach. In a first layer, only metadata areas from segments of a deduplicated cloud object are processed in order to detect corruptions in the metadata. If no corruption is detected in the metadata, a second layer analysis can be performed. The second layer analysis includes a progressive scanning of data only on objects that were not found to be corrupted in the first layer analysis.
Public/Granted literature
- US20220121376A1 SYSTEM AND METHOD FOR DETECTING CORRUPTION OF A DEDUPLICATED CLOUD OBJECT Public/Granted day:2022-04-21
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