Invention Grant
- Patent Title: Integrated circuit I/O integrity and degradation monitoring
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Application No.: US17589758Application Date: 2022-01-31
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Publication No.: US11762789B2Publication Date: 2023-09-19
- Inventor: Eyal Fayneh , Evelyn Landman , Shai Cohen , Guy Redler , Inbar Weintrob
- Applicant: PROTEANTECS LTD.
- Applicant Address: IL Haifa
- Assignee: PROTEANTECS LTD.
- Current Assignee: PROTEANTECS LTD.
- Current Assignee Address: IL Haifa
- Agency: The Roy Gross Law Firm, LLC
- Agent Roy Gross
- Main IPC: G06F13/16
- IPC: G06F13/16 ; H01L25/065 ; H01L25/18 ; H01L23/00

Abstract:
An input/output (I/O) block for a semiconductor integrated circuit (IC), which includes: at least one I/O buffer, configured to define at least one signal path in respect of a connection to a remote I/O block via a communication channel, each signal path causing a respective signal edge slope; and an I/O sensor, coupled to the at least one signal path and configured to generate an output signal indicative of one or both of: (a) a timing difference between the signal edge for a first signal path and the signal edge for a second signal path, and (b) an eye pattern parameter for one or more of the at least one signal path.
Public/Granted literature
- US20220156206A1 INTEGRATED CIRCUIT I/O INTEGRITY AND DEGRADATION MONITORING Public/Granted day:2022-05-19
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