Invention Grant
- Patent Title: System and method for reliable sensing of memory cells
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Application No.: US17195990Application Date: 2021-03-09
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Publication No.: US11763891B2Publication Date: 2023-09-19
- Inventor: Szu-Chun Tsao , Jaw-Juinn Horng
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: FOLEY & LARDNER LLP
- Main IPC: G11C16/24
- IPC: G11C16/24 ; G11C16/26

Abstract:
Disclosed herein are related to a memory system including a memory cell and a circuit to operate the memory cell. In one aspect, the circuit includes a pair of transistors to electrically couple, to the bit line, a selected one of i) a voltage source to supply a reference voltage to the memory cell and ii a sensor to sense a current through the memory cell. In one aspect, the circuit includes a first transistor. The first transistor and the bit line may be electrically coupled between the pair of transistors and the memory cell in series.
Public/Granted literature
- US20210375370A1 SYSTEM AND METHOD FOR RELIABLE SENSING OF MEMORY CELLS Public/Granted day:2021-12-02
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