Invention Grant
- Patent Title: Method for manufacturing substrate, method for manufacturing semiconductor device, substrate, and semiconductor device
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Application No.: US17014272Application Date: 2020-09-08
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Publication No.: US11764059B2Publication Date: 2023-09-19
- Inventor: Johji Nishio , Tatsuo Shimizu
- Applicant: KABUSHIKI KAISHA TOSHIBA
- Applicant Address: JP Tokyo
- Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee Address: JP Tokyo
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP 19186235 2019.10.09
- Main IPC: H01L21/02
- IPC: H01L21/02 ; H01L21/66 ; H01L29/16 ; H01L21/04 ; H01L29/06 ; H01L29/78 ; H01L29/167 ; H01L29/872 ; H01L29/739

Abstract:
According to one embodiment, a method for manufacturing a substrate is disclosed. The method can include preparing a structure body. The structure body includes a first semiconductor member and a second semiconductor member. The first semiconductor member includes silicon carbide including a first element. The second semiconductor member includes silicon carbide including a second element. The first element includes at least one selected from a first group consisting of N, P, and As. The second element includes at least one selected from a second group consisting of B, Al, and Ga. The method can include forming a hole that extends through the second semiconductor member and reaches the first semiconductor member. In addition, the method can include forming a third semiconductor member in the hole. The third semiconductor member includes silicon carbide including a third element. The third element includes at least one selected from the first group.
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