Invention Grant
- Patent Title: Vibration measurement system, vibration measurement apparatus, vibration measurement method, and computer-readable recording medium
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Application No.: US17042556Application Date: 2018-03-29
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Publication No.: US11768102B2Publication Date: 2023-09-26
- Inventor: Gaku Nakano , Masahiko Ohta , Asuka Ishii , Kazuhito Murata
- Applicant: NEC Corporation
- Applicant Address: JP Tokyo
- Assignee: NEC CORPORATION
- Current Assignee: NEC CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- International Application: PCT/JP2018/013506 2018.03.29
- International Announcement: WO2019/186984A 2019.10.03
- Date entered country: 2020-09-28
- Main IPC: G01H9/00
- IPC: G01H9/00 ; G06T7/73 ; G01B11/26

Abstract:
A vibration measurement apparatus 30 includes a detection unit 31 that acquires, as a pattern image from an image capturing apparatus 20 that shoots a measurement target surface of a structure 40, an image of the measurement target surface onto which pattern light is projected by an optical apparatus 10, and detects the pattern light from the pattern image, an estimation unit 32 that estimates an angle between the normal of the image capturing surface and the normal of the measurement target surface, based on the pattern light, an image conversion unit 33 that converts the shot image into an image that would be obtained were the normal of the measurement target surface coincident with the normal of the image capturing surface of the image capturing apparatus 20, using the estimated angle, and a vibration measurement unit 34 that measures the vibration of the structure 40 using the converted image.
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