Invention Grant
- Patent Title: Fine particle measurement device
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Application No.: US17023566Application Date: 2020-09-17
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Publication No.: US11768146B2Publication Date: 2023-09-26
- Inventor: Akinori Kimura , Asako Motomura , Yoko Sugiyama , Hiroshi Suganuma
- Applicant: Sumitomo Electric Industries, Ltd.
- Applicant Address: JP Osaka
- Assignee: Sumitomo Electric Industries, Ltd.
- Current Assignee: Sumitomo Electric Industries, Ltd.
- Current Assignee Address: JP Osaka
- Agency: McCarter & English, LLP
- Agent Michael A. Sartori
- Priority: JP 18052953 2018.03.20
- Main IPC: G01N15/14
- IPC: G01N15/14 ; G01N15/00

Abstract:
A fine particle measurement device includes a support stand (20) that has a groove (F) extending in a predetermined direction and is configured to support in the groove an observation container (10), which has an elongate shape and accommodates a liquid sample containing a fine particle therein such that an extending direction of the groove (F) coincides with a longitudinal direction of the observation container (10); and an imaging unit (40) that is configured to capture an image of the fine particle in the observation container (10) at a position where the support stand is out of a field of view, the observation container (10) being supported by the support stand (20).
Public/Granted literature
- US20210003494A1 FINE PARTICLE MEASUREMENT DEVICE Public/Granted day:2021-01-07
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